Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
from $71.16
Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices
from $115.00
Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications)
from $977.87
Secondary Ion Mass Spectrometry and Its Application to Materials Science
from $120.00
The Practice of Tof-Sims: Time of Flight Secondary Ion Mass Spectrometry
$49.95
from $40.97
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)
$35.00
from $24.01
Cluster Secondary Ion Mass Spectrometry: Principles and Applications (Wiley Series on Mass Spectrometry Book 44)
from $110.00
Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis
from $449.82
Secondary Ion Mass Spectrometry: Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (Sims Six), Palais Des Congre Ve
from $78.76
Secondary Ion Mass Spectrometry: SIMS IX
from $30.00
More results from Amazon »