Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact
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Negative bias temperature instability (NBTI) experimenT
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Modeling and Simulation of Negative Bias Temperature Instability: Degradation of Field-Effect Transistors
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Bias Temperature Instability for Devices and Circuits
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Fundamental Issues in Space Electronics Reliability: Negative Bias Temperature Instability
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Semiconductor Material and Device Characterization (IEEE Press)
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Bias Master™ - TAD, with 4 Octal Probes
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Yaegoo 110V Thermal Binding Machine 1-50MM Binding Thickness Universal Thermal Binding Machine Infrared Light Detecting Hot Melt Machine Contract Document Invoice Folder
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics Book 47)
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Semiconductors: Integrated Circuit Design for Manufacturability (Devices, Circuits, and Systems)
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