EXACT FREQUENCY-DEPENDENT COMPLEX ADMITTANCE OF THE SEMICONDUCTOR-INSULATOR-SEMICONDUCTOR (SIS) DIODE INCLUDING SURFACE STATES AND SHOCKLEY-READ-HALL (SRH) IMPURITY EFFECTS (Pamphlet)
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n-Fz Double Sided Silicon Microstrip Detector: From Fundamentals to Applications in R3B Experiment : Introduction to detectors and Proton radiation Damage Effects
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Guidelines for the Determination of Standardized Semiconductor Radiation Hardness Parameters (Technical Reports Series Book 490)
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