Secondary Ion Mass Spectroscopy of Solid Surfaces
$160.00
from $11.32
Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August ... (Springer Series in Chemical Physics, 19)
from $92.37
Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983 (Springer Series in Chemical Physics)
from $34.81
Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... 1979 (Springer Series in Chemical Physics, 9)
$94.25
from $91.36
Secondary Ion Mass Spectrometry SIMS V: Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985 (Springer Series in Chemical Physics, 44)
$95.13
from $92.78
Secondary Ion Mass Spectrometry and Its Application to Materials Science
from $114.00
Ion Traps (International Series of Monographs on Physics)
$73.88
from $61.67
Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry
from $70.79
Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
$97.37
from $65.90
Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)
from $47.00
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